Analytical Characterization of Thin Layers and Interfaces Between Thin Layers in Semiconducting Materials Devices and Magnetic Multilayers by Means of EELS and EFTEM

Grogger, Werner (Principal Investigator (PI))
Hofer, Ferdinand (Co-Investigator (CoI))
Brunegger, Albert (Co-Investigator (CoI))
Warbichler, Peter (Co-Investigator (CoI))
Kothleitner, Gerald (Co-Investigator (CoI))

Institute of Electron Microscopy and Nanoanalysis (5190)

Project: Research area

Material Science

Chemistry