ADVANCED will provide methods and prototype tools for systematically assessing reliability and robustness of mixed signal ICs. To evaluate reliability of a mixed-signal IC, we will develop specification-based and data-driven techniques to detect anomalous patterns in simulation traces. To assess design robustness, we will develop a simulation-based sensitivity-driven adaptive testing approach. The project results will be evaluated on a chip that is used in both automotive and industrial domains, thus demonstrating the broad applicability of the developed methods and tools. The project outcomes will significantly improve reliability and robustness of new designs, resulting in higher product quality and a considerable reduction of field returns.