Martina Dienstleder

19982019
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Research Output 2005 2019

2019
2018

A Quantitative EDXS Analysis of Oxide Ceramic-Electrode Systems

Lammer, J., Fisslthaler, E., Dienstleder, M. & Grogger, W., 27 Aug 2018.

Research output: Contribution to conferenceAbstractResearchpeer-review

Impact of the NO Anneal on the Microscopic Structure and Chemical Composition of the Si‐Face 4H‐SiC/SiO2 Interface

Gruber, G., Gspan, C., Fisslthaler, E., Dienstleder, M., Pobegen, G., Aichinger, T., Meszaros, R., Grogger, W. & Hadley, P., 2018, In : Advanced energy materials. 5, p. 1800022 7 p.

Research output: Contribution to journalArticleResearchpeer-review

Open Access
2017

Challenges in sample preparation for HRSTEM analysis

Dienstleder, M. & Kothleitner, G., 2017, ASEM. p. 49

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

In situ heating studies of diffusion barrier layers for semiconductor devices

Knez, D., Dienstleder, M., Grogger, W., Hofer, F. & Fisslthaler, E., 2017.

Research output: Contribution to conferencePosterResearch

File

Investigation of domains in Pr2NiO4+delta by transmission electron microscopy

Gspan, C., Bucher, E., Egger, A., Schrödl, N., Berger, C., Dienstleder, M., Mitsche, S., Sitte, W. & Grogger, W., 2017, 13th Multinational Congress on Microscopy September 24-29, 2017 in Rovinj, Croatia. p. 622-625

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Low energy argon ion sample preparation for HRSTEM analysis

Dienstleder, M., Fisslthaler, E., Gspan, C. & Kothleitner, G., 2017.

Research output: Contribution to conferencePosterResearch

File

Preparation of Transmission Electron Microscopy Samples by Mechanical Techniques in Combination with Low-Voltage Ion Milling

Trummer, C., Dienstleder, M. & Kothleitner, G., 2017, ASEM. p. 46

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

2016

Optimization of post-tratment of TEM lamella by low-energy ion milling

Seidl, R., Dienstleder, M., Grogger, W. & Fisslthaler, E., 2016, 6th ASEM-Workshop. Leoben, p. 20 1 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Precipitation of Long-Period Stacking Ordered Structure in Mg–Gd–Zn–Mn Alloy

Li, J., Albu, M., Wu, Y., Peng, L., Dienstleder, M., Kothleitner, G., Hofer, F. & Schumacher, P., 22 Dec 2016, In : Advanced Engineering Materials. p. 74-77

Research output: Contribution to journalArticleResearchpeer-review

2015

Focused Ion Beam Preparation for Transmission Electron Microscopy

Dienstleder, M., Gspan, C., Kothleitner, G. & Hofer, F., 23 Aug 2015.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Focused Ion Beam Preparation for Transmission Electron Microscopy

Dienstleder, M., Gspan, C., Kothleitner, G. & Hofer, F., 2015, Multinational Congress on Microscopy. ., p. O-135-101-103

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy

Mitsche, S., Haberfehlner, G., Dienstleder, M. & Pölt, P., 2015, Modern development and applications in microbeam analysis. ., p. 373-373

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy

Mitsche, S., Melischnig, A., Haberfehlner, G., Dienstleder, M. & Pölt, P., 3 May 2015.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

2014

Linking TEM Analytical Spectroscopies for an Assumptionless Compositional Analysis

Kothleitner, G., Grogger, W., Dienstleder, M. & Hofer, F., 2014, In : Microscopy and microanalysis. 20, p. 676-686

Research output: Contribution to journalArticleResearchpeer-review

Temperature Evolution during Focused Ion Beam Processing of Soft Matter: From Fundamentals towards TEM Lamella Preparation

Schmied, R., Orthacker, A., Kraxner, J., Fröch, J., Chernev, B. S., Dienstleder, M. & Plank, H., 8 May 2014.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

2013

Probing deep polymer layers - preparing for a dive

Wilhelm, P., Chernev, B. S., Mayrhofer, C. & Dienstleder, M., 2013, European Symposium on Polymer Spectroscopy. ., p. 39-39

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Probing deep polymer layers - preparing for a dive

Wilhelm, P., Chernev, B. S., Mayrhofer, C. & Dienstleder, M., 7 Jul 2013.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

2012

30M Progress Report in ESiP

Dienstleder, M., Gspan, C. & Grogger, W., 8 Nov 2012.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

2011

Fundamental proximity effects for electron beam induced deposition processes

Schmied, R., Gspan, C., Dienstleder, M., Michelitsch, S. & Plank, H., 2011, Multinational Congress on Microscopy. ., p. 517-518

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Fundamental Proximity Effects of Electron Beam Induced Platinum Deposition

Schmied, R., Gspan, C., Dienstleder, M., Michelitsch, S. & Plank, H., 4 Sep 2011.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

2010

Raman microprobe imaging of submicron polymer structures and interdisciplinary characterization of beam damage

Plank, H., Chernev, B. S., Sezen, M., Dienstleder, M., Haber, T., Wilhelm, P. & Hofer, F., 2010.

Research output: Contribution to conferencePosterResearch

Raman microprobe imaging of submicron structures and interdisciplinary characterization of beam damage

Wilhelm, P., Chernev, B. S., Plank, H., Sezen, M., Dienstleder, M. & Hofer, F., 29 Aug 2010.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

2009

The Effect of FIB Process Parameters on the Surface Morphology of Thin Lamellas

Dienstleder, M., Plank, H., Gspan, C., Kothleitner, G. & Hofer, F., 29 Jun 2009.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

The Effect of Process Parameters on the Surface Morphology of Thin FIB Lamellas

Dienstleder, M., Plank, H., Gspan, C., Kothleitner, G. & Hofer, F., 2009, Instrumentation and Methodology. Wien: Facultas, p. 253-254 (Instrumentation and Methodology).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

The Effect of Process Parameters on the Surface Morphology of Thin FIB Lamellas

Dienstleder, M., Plank, H., Gspan, C., Kothleitner, G. & Hofer, F., 2009.

Research output: Contribution to conferencePosterResearch

2008

A novel method for precipitates preparation using extraction replica combined with focused ion beam techniques

Dienstleder, M., Plank, H., Gspan, C., Albu, M. & Kothleitner, G., 3 Jul 2008.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

A novel method for precipitates preparation using extraction replicas combined with focused ion beam techniques

Dienstleder, M., Plank, H., Kothleitner, G. & Hofer, F., 2008, European Microscopy Congress. Berlin: Springer, Vol. Volum1. p. 807-809 (Instrumentation and Methods).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

A novel method for precipitates preparation using replica extraction combined with focused ion beam techniques

Dienstleder, M., Plank, H., Gspan, C., Kothleitner, G. & Hofer, F., 1 Sep 2008.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Investigation of Yb substitution in the calthrate phase EU8Ga16Ge30

Paschen, S., Gspan, C., Grogger, W., Dienstleder, M., Laumann, S., Pongratz, P., Sassik, H., Wernisch, J. & Prokofiev, A., 2008, In : Journal of Crystal Growth. 310, p. 1853-1858

Research output: Contribution to journalArticleResearchpeer-review

Low-loss EELS measurements on an oxide multilayer system using monochrome

Kothleitner, G., Schaffer, B. & Dienstleder, M., 1 Sep 2008.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Low-loss EELS measurements on an oxide multilayer system using monochrome electrons

Kothleitner, G., Schaffer, B. & Dienstleder, M., 2008, European Microscopy Congress. Berlin: Springer, Vol. Volume1. p. 399-400 (Instrumentation and Methods).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Process Parameters for Particle Induced Deposition

Plank, H., Gspan, C., Dienstleder, M., Kothleitner, G. & Hofer, F., 3 Jul 2008.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

The influence of beam defocus on volume growth rates for electron beam induced platinum deposition

Plank, H., Gspan, C., Dienstleder, M., Kothleitner, G. & Hofer, F., 2008, In : Nanotechnology. 19, 48, p. 485302-485311

Research output: Contribution to journalArticleResearchpeer-review

The influence of beam defocus on volume growth rates for electron beam induced platinum deposition

Plank, H., Dienstleder, M., Kothleitner, G. & Hofer, F., 2008, European Microscopy Congress. Berlin: Springer, Vol. Volume1. p. 683-684 (Instrumentation and Methods).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

2007

in-situ TEM Probenpräparation von verspannten Proben mittels Sandwich Technik

Rogers, M. & Dienstleder, M., 2007.

Research output: Contribution to conferencePosterResearch

2005

Optimization of the FIB milling conditions for RTP-processed Niobium and Tantalumnitride thin films on silicon substrates

Dienstleder, M., Rogers, M., Kothleitner, G., Hofer, F. & Kolbesen, B. O., 2005, Microscopy Conference - Dreiländertagung. ., p. 4-4

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

TEM, EELS, and EFTEM: Application to Semiconductor Materials and Device Characterization

Grogger, W., Gspan, C., Schaffer, B., Dienstleder, M., Rogers, M., Brunegger, A. & Hofer, F., 15 Sep 2005.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch