1995 …2022
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Research Output 2001 2019

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Chapter
2006

Electrostatic Discharge Models

Deutschmann, B., 2006, Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility. 1 ed. New York, NY: Springer, p. 189-200

Research output: Chapter in Book/Report/Conference proceedingChapterResearch

2003

Improvement of system robustness through EMC optimization

Deutschmann, B., 2003, Analog Circuit Design: Fractional-N Synthesizers, Design for Robustness, Line and Bus Drivers. Roermund, A., Steyaert, M. & Huijsing, J. H. (eds.). 1 ed. Boston, Mass. [u.a.]: Kluwer, p. 227-242

Research output: Chapter in Book/Report/Conference proceedingChapterResearch