Universal Pressure Scanning Electron Microscopy (UPSEM) - Electron Microscopy from High Vacuum to Atmospheric Pressure

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period21 Aug 201725 Aug 2017
Event titleMicroscopy Conference 2017: MC17
Event typeConference
LocationLausanne, Switzerland
Degree of RecognitionInternational

ASJC Scopus subject areas

  • Materials Science(all)

Treatment code (Nähere Zuordnung)

  • Application

Fields of Expertise

  • Advanced Materials Science