Universal Pressure Scanning Electron Microscopy (UPSEM) - Electron Microscopy from High Vacuum to Atmospheric Pressure

Rattenberger, J. (Speaker)

Activity: Talk or presentation › Talk at conference or symposium › Science to science

Period21 Aug 2017 → 25 Aug 2017
Event titleMicroscopy Conference 2017: MC17
Event typeConference
LocationLausanne, Switzerland
Degree of RecognitionInternational

ASJC Scopus subject areas

  • Materials Science(all)

Treatment code (Nähere Zuordnung)

  • Application

Fields of Expertise

  • Advanced Materials Science