Total ionizing dose effects on MOS transistors fabricated in 0.18 µm CMOS technology

Varvara Bezhenova (Speaker)

Activity: Talk or presentationPoster presentationScience to science

Period18 May 2016 - 21 May 2016
Held atAsia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity (APEMC)
Event typeConference
LocationShenzhen, China
Degree of RecognitionInternational

Keywords

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation
  • Information, Communication & Computing