Total ionizing dose effects on MOS transistors fabricated in 0.18 µm CMOS technology

Varvara Bezhenova (Speaker)

Activity: Talk or presentationPoster presentationScience to science

Period18 May 201621 May 2016
Event titleAsia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity (APEMC)
Event typeConference
LocationShenzhen, China
Degree of RecognitionInternational

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

Fields of Expertise

  • Information, Communication & Computing