TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE

Varvara Bezhenova (Speaker), Michalowska-Forsyth, A. M. (Speaker)

Activity: Talk or presentationPoster presentationScience to science

Period23 Oct 201726 Oct 2017
Event titleThe 13th International School on the Effects of Radiation on Embedded Systems for Space Applications
Event typeWorkshop
Conference number13
LocationGarching, Germany
Degree of RecognitionInternational

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

Fields of Expertise

  • Information, Communication & Computing