TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE

Varvara Bezhenova (Speaker), Michalowska-Forsyth, A. M. (Speaker)

Activity: Talk or presentationPoster presentationScience to science

Period23 Oct 2017 - 26 Oct 2017
Held atThe 13th International School on the Effects of Radiation on Embedded Systems for Space Applications
Event typeWorkshop
Conference number13
LocationGarching, Germany
Degree of RecognitionInternational


  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation
  • Information, Communication & Computing