The Impact of High-Tension on the Orbital Mapping of Rutile by STEM-EELS

Description

Recently, it was shown that scanning transmission electron microscopy (STEM) in combination with electron energy loss spectroscopy (EELS) allows for a real-space mapping of atomic orbitals of rutile at 80 kV [1]. The major challenge of such experiments is the inherently poor signal-to-noise ratio (SNR). We propose a reliable post processing path for mapping orbitals and demonstrate the mapping of orbitals for rutile at different operation voltages.
Due to the different bond lengths between titanium and oxygen, rutile exhibits orbitals which are rotated 90° to each other when viewed along the [001]-direction (Figure 1a). The specimen is prepared by wedge polishing and focused ion milling. The measurements are performed with a FEI Titan³ G2 equipped with a monochromator and Cs-corrector. The EELS signal is recorded by a K2 (Gatan) direct detection camera, which offers higher SNR through its much-improved detective quantum efficiency.

Period	20 May 2021 → 21 May 2021
Event title	11th ASEM Workshop
Event type	Conference
Location	Linz, AustriaShow on map