Statistical Analysis of Semiconductor Images

Sarah Karasek (Speaker), Friedl, H. (Contributor), Peter Scheibelhofer (Contributor)

Activity: Talk or presentationTalk at workshop, seminar or courseScience to science

Period16 Jul 2018 - 20 Jul 2018
Held atInternational Workshop on Statistical Modelling 2018
Event typeConference
LocationBristol, United Kingdom
Degree of RecognitionInternational