Statistical Analysis of Semiconductor Images

  • Sarah Karasek (Speaker)
  • Friedl, H. (Contributor)
  • Peter Scheibelhofer (Contributor)

Activity: Talk or presentationTalk at workshop, seminar or courseScience to science

Period16 Jul 201820 Jul 2018
Event titleInternational Workshop on Statistical Modelling 2018
Event typeConference
LocationBristol, United Kingdom
Degree of RecognitionInternational