Soft-Failures in Component-Level ESD Testing on the Example of Flip-Flop Data Retention

Schrey, P. (Speaker)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period22 Oct 2019
Event titleThe 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits
Event typeConference
LocationHaining, China
Degree of RecognitionInternational