Small Angle X-ray Scattering for Metrology on the nm-Scale

Amenitsch, H. (Speaker), Michele Devetta (Contributor), Paolo Piseri (Contributor)

Activity: Talk or presentationInvited talk at conference or symposiumScience to science

Period19 Sep 2017
Held atMNE 2017
Event typeConference
LocationBraga, Portugal
Degree of RecognitionInternational

Keywords

  • Materials Science(all)
  • Physical and Theoretical Chemistry
  • Advanced Materials Science