Small Angle X-ray Scattering for Metrology on the nm-Scale

Amenitsch, H. (Speaker), Michele Devetta (Contributor), Paolo Piseri (Contributor)

Activity: Talk or presentationInvited talk at conference or symposiumScience to science

Period19 Sep 2017
Event titleMNE 2017: 43rd Micro Nano Engineering conference
Event typeConference
LocationBraga, Portugal
Degree of RecognitionInternational

ASJC Scopus subject areas

  • Materials Science(all)
  • Physical and Theoretical Chemistry

Fields of Expertise

  • Advanced Materials Science