Semicon/Europe 90 - Technical Conference

Lammer, A. (Speaker)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Description

Parallel Test of Digital ASICs
Period7 Mar 1990
Event titleSemicon/Europe 90 - Technical Conference
Event typeConference
LocationZürich, Switzerland

Keywords

  • Intergrated Circuits Testing
  • Parallel Test
  • CMOS Technology
  • ASICs

ASJC Scopus subject areas

  • Engineering(all)

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application