Optical measurement systems for industrial inspection IV, SPIE International Symposium Optical Metrology

Thomas Thurner (Speaker)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Description

Talk: Robust high precision 2d optical range sensor
Period13 Jun 2005 - 17 Jun 2005
Held atOptical measurement systems for industrial inspection IV, SPIE International Symposium Optical Metrology
Event typeConference