AFM Based High-Speed Tomography in Electron and Ion Beam Microscopes

Activity: Talk or presentation › Talk at conference or symposium › Science to science

Description

AFM Based High-Speed Tomography in Electron and Ion Beam Microscopes
Period28 Mar 2016 → 2 Apr 2016
Event titleMRS Spring Meeting 2016
Event typeConference
LocationPhoenix, United StatesShow on map

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)