Model Based Clustering to Classify Wafer Images

Friedl, H. (Speaker), Sarah Karasek (Contributor), Peter Scheibelhofer (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period13 Sep 2018
Held atStatistische Woche 2018
Event typeConference
LocationLinz, Austria
Degree of RecognitionInternational