Model Based Clustering to Classify Wafer Images

  • Friedl, H. (Speaker)
  • Sarah Karasek (Contributor)
  • Peter Scheibelhofer (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period13 Sep 2018
Event titleStatistische Woche 2018
Event typeConference
LocationLinz, AustriaShow on map
Degree of RecognitionInternational