Measuring the Temperature Homogeneity Across FIB Lamellae for In-Situ TEM Experiments via Raman Scattering in Crystalline Silicon

  • Robert Krisper (Speaker)

Activity: Talk or presentation › Talk at conference or symposium › Science to science

Period19 Sept 2019
Event title14th Multinational Congress on Microscopy
Event typeConference
LocationBelgrad, SerbiaShow on map
Degree of RecognitionInternational

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)