Measuring the Temperature Homogeneity Across FIB Lamellae for In-Situ TEM Experiments via Raman Scattering in Crystalline Silicon

Krisper, R. (Speaker)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period19 Sep 2019
Event title14th Multinational Congress on Microscopy
Event typeConference
LocationBelgrad, Serbia
Degree of RecognitionInternational

ASJC Scopus subject areas

  • Materials Science(all)

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Fields of Expertise

  • Advanced Materials Science