Measuring the Temperature Homogeneity Across FIB Lamellae for In-Situ TEM Experiments via Raman Scattering in Crystalline Silicon

Krisper, R. (Speaker)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period19 Sep 2019
Held at14th Multinational Congress on Microscopy
Event typeConference
LocationBelgrad, Serbia
Degree of RecognitionInternational

Keywords

  • Materials Science(all)
  • Advanced Materials Science
  • Basic - Fundamental (Grundlagenforschung)