International Test Conference 1999

Lammer, A. (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Description

Panel Session: Sunset Boulevard for IDDQ
Period30 Sep 1999
Event titleInternational Test Conference 1999
Event typeConference
LocationAtlantic City, United States

Keywords

  • Integrated Circuits Testing
  • Current Measurement
  • CMOS Technology

Treatment code (Nähere Zuordnung)

  • Application

ASJC Scopus subject areas

  • Engineering(all)

Fields of Expertise

  • Information, Communication & Computing