Skip to main navigation
Skip to search
Skip to main content
Graz University of Technology Home
English
Deutsch
Home
Persons
Publications
Organisations
Projects
Activities
Prizes
Press/Media
Search by expertise, name or affiliation
Improving integrated circuit reliability by combining tests to ionizing radiation and electromagnetic compatibility
Fabian Vargas (Speaker)
Deutschmann, B.
(Speaker)
Sonia Ben Dhia (Speaker)
Czepl, N.
(Speaker)
Michalowska-Forsyth, A. M.
(Speaker)
Institute of Electronics (4390)
Activity
:
Talk or presentation
›
Talk at conference or symposium
›
Science to science
Period
3 Mar 2022
Event title
13th Latin American Symposium on Circuits and Systems: LASCAS 2022
Event type
Conference
Location
Santiago, Chile
Show on map
Degree of Recognition
International
Keywords
Radiation Hardness
EMC
EMI
electromagnetic compatibility
IC Design
Fields of Expertise
Information, Communication & Computing