IEEE 2016 International Instrumentation and Measurement Technology Conference

Matthias Flatscher (Speaker)

    Activity: Talk or presentationTalk at conference or symposiumScience to science

    Description

    Talk: Front-End Circuit Modeling for Low-Z Capacitance Measurement Applications
    Period25 May 2016
    Event titleIEEE 2016 International Instrumentation and Measurement Technology Conference
    Event typeConference
    LocationTaipei, Taiwan, Province of China