IEEE 2016 International Instrumentation and Measurement Technology Conference

Matthias Flatscher (Speaker)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Description

Talk: Front-End Circuit Modeling for Low-Z Capacitance Measurement Applications
Period25 May 2016
Held atIEEE 2016 International Instrumentation and Measurement Technology Conference
Event typeConference
LocationTaipei, Taiwan, Province of China