Electron Beam Induced Dynamics of Atoms and Clusters-Experiments and Simulations

Hofer, F. (Speaker), Knez, D. (Contributor)

Activity: Talk or presentationInvited talk at conference or symposiumScience to science

Period30 Apr 20174 May 2017
Event titleConference on Frontiers of Aberration Corrected Electron Microscopy
Event typeConference
Conference number4
LocationKasteel Vaalsbroek, Netherlands
Degree of RecognitionInternational

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

ASJC Scopus subject areas

  • Materials Science(all)