Electromagnetic Compatibility of Integrated Circuits – An Introduction to EMC Test Methods

Deutschmann, B. (Speaker)

Activity: Talk or presentationInvited talk at conference or symposiumScience to public

Period12 Mar 2018 - 16 Mar 2018
Held at19th IEEE Latin-American Test Symposium (LATS2018)
Event typeConference
LocationSao Paulo, Brazil
Degree of RecognitionInternational

Keywords

  • EMC
  • Integrated Circuits Testing
  • Emission
  • IEC 61967
  • IEC 62132
  • Electrical and Electronic Engineering
  • Information, Communication & Computing