Electromagnetic Compatibility of Integrated Circuits – An Introduction to EMC Test Methods

Activity: Talk or presentation › Invited talk at conference or symposium › Science to public

Period12 Mar 2018 → 16 Mar 2018
Event title19th IEEE Latin-American Test Symposium (LATS2018)
Event typeConference
LocationSao Paulo, BrazilShow on map
Degree of RecognitionInternational

Keywords

  • EMC
  • Integrated Circuits Testing
  • Emission
  • IEC 61967
  • IEC 62132

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fields of Expertise

  • Information, Communication & Computing