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Electrical Characterization of Semiconductor Nanostructures by Conductive Probe Based Atomic Force Microscopy
Hadley, P.
(Agent)
Institute of Solid State Physics (5130)
Activity
:
Examination or supervision
›
External examination
Description
Dissertation
Period
1 Apr 2011
Examinee
Igor Beinik
Examination held at
Montanuniversität Leoben