Dose Rate Effects in MOS Transistors

Varvara Bezhenova (Speaker)
Michalowska-Forsyth, A. M. (Contributor)

Institute of Electronics (4390)

Activity: Talk or presentation › Talk at conference or symposium › Science to science

Period	10 Apr 2019
Event title	Radhard Symposium
Event type	Conference
Conference number	4
Location	Seibersdorf, AustriaShow on map
Degree of Recognition	International

Keywords

MOSFET
ELDRS
Radiation Hardness
Shallow Trench Isolation
Radiation Assurance Testing
Total Ionizing Dose

Related content

Projects
FWF - Robust IC - Studies of robustness of analog integrated circuits
Project: Research project

Publications
Dose Rate Effects in MOS Transistors
Research output: Chapter in Book/Report/Conference proceeding › Conference paper