Dose Rate Effects in MOS Transistors

Varvara Bezhenova (Speaker), Michalowska-Forsyth, A. M. (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period10 Apr 2019
Event titleRadhard Symposium
Event typeConference
Conference number4
LocationSeibersdorf, Austria
Degree of RecognitionInternational

Keywords

  • MOSFET
  • ELDRS
  • Radiation Hardness
  • Shallow Trench Isolation
  • Radiation Assurance Testing
  • Total Ionizing Dose