Direct measurements of contact resistance in MoS2-based thin film transistors via Kelvin probe force microscopy

Aleksandar Matkovic (Speaker), Andreas Petritz (Contributor), Gerburg Schider (Contributor), Markus Krammer (Contributor), Markus Kratzer (Contributor), Esther Karner-Petritz (Contributor), Alexander Fian (Contributor), Herbert Gold (Contributor), Michael Gärtner (Contributor), Andreas Terfort (Contributor), Christian Teichert (Contributor), Zojer, E. (Contributor), Zojer, K. (Contributor), Barbara Stadlober (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period2019
Event titleJoint Annual Meeting of the Swiss
Event typeConference
LocationZürich, Switzerland
Degree of RecognitionInternational

Fields of Expertise

  • Advanced Materials Science