Direct measurements of contact resistance in MoS2-based thin film transistors via Kelvin probe force microscopy

  • Aleksandar Matkovic (Speaker)
  • Andreas Petritz (Contributor)
  • Gerburg Schider (Contributor)
  • Markus Krammer (Contributor)
  • Markus Kratzer (Contributor)
  • Esther Karner-Petritz (Contributor)
  • Alexander Fian (Contributor)
  • Herbert Gold (Contributor)
  • Michael Gärtner (Contributor)
  • Andreas Terfort (Contributor)
  • Christian Teichert (Contributor)
  • Zojer, E. (Contributor)
  • Zojer, K. (Contributor)
  • Barbara Stadlober (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period2019
Event titleJoint Annual Meeting of the Swiss
Event typeConference
LocationZürich, Switzerland
Degree of RecognitionInternational

Fields of Expertise

  • Advanced Materials Science