Contactless T-Measurement of Wire-Based Electron Beam Additive Manufacturing Ti-6Al-4V

Pixner, F. (Speaker), Enzinger, N. (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period25 Jul 2020
Event titleIIW On-Line Annual Assembly 2020
Event typeConference
LocationVirtuell, Singapore
Degree of RecognitionInternational

Fields of Expertise

  • Advanced Materials Science