Compositional quantification of inelastic atomic resolution STEM images

Kothleitner, G. (Speaker)

Activity: Talk or presentationInvited talk at conference or symposiumScience to science

Period16 Jan 2017
Held atSub-nm Materials Technologies Workshop
Event typeWorkshop
LocationSingapur, Singapore
Degree of RecognitionInternational

Keywords

  • Materials Science(all)
  • Advanced Materials Science
  • Basic - Fundamental (Grundlagenforschung)