Characterising Soft-Failures in Component-Level ESD Testing

  • Patrick Schrey (Speaker)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period3 Jul 2018
Event title14th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2018: PRIME 2018
Event typeConference
Conference number14
SponsorsAllegro MicroSystems, LLC, Dialog Semiconductor, ON Semiconductor
LocationPrague, Slovakia
Degree of RecognitionInternational