Broad and focused low energy ion milling procedures for the optimization of high resolution TEM samples

Plank, H. (Speaker)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period19 Jun 2018 - 20 Jun 2018
Held atEuropean FIB Network 2018
Event typeConference
LocationGrenoble, France

Keywords

  • Materials Science(all)
  • Advanced Materials Science
  • Basic - Fundamental (Grundlagenforschung)