Broad and focused low energy ion milling procedures for the optimization of high resolution TEM samples

Plank, H. (Speaker)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period19 Jun 201820 Jun 2018
Event titleEuropean FIB Network 2018
Event typeConference
LocationGrenoble, France

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Fields of Expertise

  • Advanced Materials Science

ASJC Scopus subject areas

  • Materials Science(all)