Bayesian Analysis of Femtosecond Pump-Probe Photoion Coincidence Measurements

Heim, P. (Speaker), Rumetshofer, M. (Contributor), Thaler, B. (Contributor), Ernst, W. E. (Contributor), Koch, M. (Contributor), von der Linden, W. (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period12 Sep 2018
Held at68th Annual Meeting of the Austrian Physical Society
Event typeConference
Conference number68
LocationGraz, Austria
Degree of RecognitionInternational

Keywords

  • Advanced Materials Science