Bayesian Analysis of Femtosecond Pump-Probe Photoion Coincidence Measurements

Heim, P. (Speaker), Rumetshofer, M. (Contributor), Thaler, B. (Contributor), Ernst, W. E. (Contributor), Koch, M. (Contributor), von der Linden, W. (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period12 Sep 2018
Event typeConference
Conference number68
LocationGraz, Austria
Degree of RecognitionInternational

Keywords

  • Advanced Materials Science