Bayesian Analysis of Femtosecond Pump-Probe Photoelectron-Photoion Coincidence Spectra

Heim, P. (Contributor), Rumetshofer, M. (Contributor), Ranftl, S. (Speaker), Thaler, B. (Contributor), Ernst, W. E. (Contributor), Koch, M. (Contributor), von der Linden, W. (Contributor)

Activity: Talk or presentationTalk at workshop, seminar or courseScience to science

Period2 Jun 2018 - 6 Jun 2018
Held atInternational Workshop on Bayesian Inference and Maximum Entropy<br/>Methods in Science and Engineering
Event typeConference
Conference number38
LocationLondon, United Kingdom
Degree of RecognitionInternational

Keywords

  • Advanced Materials Science