Assessing the quality of wafer images

  • Sarah Karasek (Speaker)
  • Friedl, H. (Contributor)
  • Peter Scheibelhofer (Contributor)

Activity: Talk or presentationTalk at conference or symposiumScience to science

Period28 May 2017
Event titleENBIS Spring Meeting on Predictive Maintenance and Reliability with Big and Complex Data
Event typeWorkshop
LocationAigen-Schlägl, AustriaShow on map