Ankaufstest: Hochauflösungsrasterelektronenmikroskop - FEI Nano-SEM im FEI Nanoport Eindhoven

Schröttner, H. (Consultant)

Activity: Consultancy or evaluationConsultancy

Period14 Dec 2005 - 15 Dec 2005
Held atInstitute of Electron Microscopy and Nanoanalysis (5190)
Degree of RecognitionInternational

Keywords

  • Advanced Materials Science