Ankaufstest: Hochauflösungsrasterelektronenmikroskop - FEI Nano-SEM im FEI Nanoport Eindhoven

Activity: Consultancy or evaluation › Consultancy

Period14 Dec 2005 → 15 Dec 2005
Held atInstitute of Electron Microscopy and Nanoanalysis (5190)
Degree of RecognitionInternational

Fields of Expertise

  • Advanced Materials Science