Alternative Patterning Strategies for Reduced Thermal Stress during Focused Ion Beam Processing

Plank, H. (Speaker)

Institute of Electron Microscopy and Nanoanalysis (5190)

Activity: Talk or presentation › Invited talk at conference or symposium › Science to science

Period	4 Sept 2011 → 9 Sept 2011
Event title	MCM 2011: MCM 2011
Event type	Conference
Location	Urbino, ItalyShow on map

Keywords

Focused Ion Beam Processing
Soft Matter