1st ACM International Workshop on the Engineering of Reliable, Robust, and Secure Embedded Wireless Sensing Systems (FAILSAFE) (Event)

Saukh, O. (Peer reviewer)

Activity: Publication peer-review or editorial workPeer review of manuscripts

Description

TPC member
Period1 Sep 201715 Sep 2017
Event typeWorkshop
LocationDelft, Netherlands
Degree of RecognitionInternational