@article{bd5e44bde2d24a16b7c3616762e46ae6,
title = "X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments",
author = "Alfred Neuhold and Jiri Novak and Heinz-Georg Flesch and Armin Moser and Tatjana Djuric and Linda Grodd and Souren Grigorian and Ulrich Pietsch and Roland Resel",
year = "2012",
doi = "10.1016/j.nimb.2011.07.105",
language = "English",
volume = "284",
pages = "64--68",
journal = "Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms ",
issn = "1872-9584",
publisher = "Elsevier B.V.",
}