X-ray based tools for the investigation of buried interfaces in organic electronic devices

Alfred Neuhold, Hannes Brandner, Simon Außerlechner, Stefan Lorbek, Markus Neuschitzer, Egbert Zojer, Christian Teichert, Roland Resel

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Originalspracheenglisch
Seiten (von - bis)479-487
FachzeitschriftOrganic electronics
Jahrgang14
DOIs
PublikationsstatusVeröffentlicht - 2013

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

X-ray based tools for the investigation of buried interfaces in organic electronic devices. / Neuhold, Alfred; Brandner, Hannes; Außerlechner, Simon; Lorbek, Stefan; Neuschitzer, Markus; Zojer, Egbert; Teichert, Christian; Resel, Roland.

in: Organic electronics, Jahrgang 14, 2013, S. 479-487.

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Neuhold, Alfred ; Brandner, Hannes ; Außerlechner, Simon ; Lorbek, Stefan ; Neuschitzer, Markus ; Zojer, Egbert ; Teichert, Christian ; Resel, Roland. / X-ray based tools for the investigation of buried interfaces in organic electronic devices. in: Organic electronics. 2013 ; Jahrgang 14. S. 479-487.
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AU - Neuhold, Alfred

AU - Brandner, Hannes

AU - Außerlechner, Simon

AU - Lorbek, Stefan

AU - Neuschitzer, Markus

AU - Zojer, Egbert

AU - Teichert, Christian

AU - Resel, Roland

PY - 2013

Y1 - 2013

U2 - 10.1016/j.orgel.2012.11.016

DO - 10.1016/j.orgel.2012.11.016

M3 - Article

VL - 14

SP - 479

EP - 487

JO - Organic electronics

JF - Organic electronics

SN - 1566-1199

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