White Paper 3 System Level ESD Part III: Review of IEC 61000-4-2 ESD Testing and Impact on System-Efficient ESD Design (SEED)

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in Buch/Bericht

Abstract

This white paper presents the recent knowledge of system ESD field events and air discharge testing methods. Testing experience with the IEC 61000-4-2 (2008) and the ISO 10605 ESD standards has shown a range of differing interpretations of the test method and its scope. This often results in misapplication of the test method and a high test result uncertainty. This white paper aims to explain the problems observed and to suggest improvements to the ESD test standard and to enable a correlation with a SEED IC/PCB co-design methodology. This white paper is divided into a part on direct pin stressing (Part A) and IEC 61000-4-2 testing of chassis and display which is typically a type of air discharge (Part B). Part A discusses the necessary industry alignments and standardization to support a unified SEED design procedure. Part B provides the input to improve the calibration and test reliability of IEC 61000-4-2 in the air discharge mode.
Originalspracheenglisch
TitelWhite paper III
PublikationsstatusVeröffentlicht - 1 Nov 2020

Fields of Expertise

  • Information, Communication & Computing

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