When BDDs Fail: Conformance Testing with Symbolic Execution and SMT Solving

Elisabeth Jöbstl; Martin Weiglhofer; Bernhard Aichernig; Franz Wotawa

When BDDs Fail: Conformance Testing with Symbolic Execution and SMT Solving

Elisabeth Jöbstl, Martin Weiglhofer, Bernhard Aichernig, Franz Wotawa

Institut für Softwaretechnologie (7160)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	2010 Third International Conference on Software Testing, Verification and Validation (ICST 2010)
Herausgeber (Verlag)	Institute of Electrical and Electronics Engineers
Seiten	479-488
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	3rd International Conference on Software Testing, Verification and Validation: ICST 2010 - Paris, Frankreich Dauer: 6 Apr. 2010 → 10 Apr. 2010

Konferenz

Konferenz	3rd International Conference on Software Testing, Verification and Validation
Land/Gebiet	Frankreich
Ort	Paris
Zeitraum	6/04/10 → 10/04/10

Fields of Expertise

Information, Communication & Computing

EU-MOGENTES - Model-based Generation of Tests for Dependable Embedded Systems
Brandl, H., Krenn, W. K. & Aichernig, B.
1/01/08 → 31/12/10
Projekt: Forschungsprojekt

Dieses zitieren

When BDDs Fail: Conformance Testing with Symbolic Execution and SMT Solving. / Jöbstl, Elisabeth; Weiglhofer, Martin; Aichernig, Bernhard et al.
2010 Third International Conference on Software Testing, Verification and Validation (ICST 2010). Institute of Electrical and Electronics Engineers, 2010. S. 479-488.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Jöbstl, E, Weiglhofer, M, Aichernig, B & Wotawa, F 2010, When BDDs Fail: Conformance Testing with Symbolic Execution and SMT Solving. in 2010 Third International Conference on Software Testing, Verification and Validation (ICST 2010). Institute of Electrical and Electronics Engineers, S. 479-488, 3rd International Conference on Software Testing, Verification and Validation, Paris, Frankreich, 6/04/10.

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year = "2010",

language = "English",

pages = "479--488",

booktitle = "2010 Third International Conference on Software Testing, Verification and Validation (ICST 2010)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "Third International Conference on Software Testing, Verification and Validation : ICST 2010 ; Conference date: 06-04-2010 Through 10-04-2010",

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TY - GEN

T1 - When BDDs Fail: Conformance Testing with Symbolic Execution and SMT Solving

AU - Jöbstl, Elisabeth

AU - Weiglhofer, Martin

AU - Aichernig, Bernhard

AU - Wotawa, Franz

PY - 2010

Y1 - 2010

M3 - Conference paper

SP - 479

EP - 488

BT - 2010 Third International Conference on Software Testing, Verification and Validation (ICST 2010)

PB - Institute of Electrical and Electronics Engineers

T2 - Third International Conference on Software Testing, Verification and Validation

Y2 - 6 April 2010 through 10 April 2010

ER -

When BDDs Fail: Conformance Testing with Symbolic Execution and SMT Solving

Konferenz

Fields of Expertise

Projekte

EU-MOGENTES - Model-based Generation of Tests for Dependable Embedded Systems

Dieses zitieren