Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress

Michael Fuchs; Markus Sievers; Bernd Deutschmann

doi:10.1109/APEC39645.2020.9124365

Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress

Titel in Übersetzung: Spannungsabhängigkeit und Charakterisierung von Keramik-Kondensatoren unter elektrischer Beanspruchung

Michael Fuchs, Markus Sievers, Bernd Deutschmann

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.

Titel in Übersetzung	Spannungsabhängigkeit und Charakterisierung von Keramik-Kondensatoren unter elektrischer Beanspruchung
Originalsprache	englisch
Titel	APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition
Herausgeber (Verlag)	Institute of Electrical and Electronics Engineers
Seiten	2815-2821
Seitenumfang	7
ISBN (elektronisch)	9781728148298
DOIs	https://doi.org/10.1109/APEC39645.2020.9124365
Publikationsstatus	Veröffentlicht - März 2020
Veranstaltung	35th Annual IEEE Applied Power Electronics Conference and Exposition: APEC 2020 - New Orleans, USA / Vereinigte Staaten Dauer: 15 März 2020 → 19 März 2020

Konferenz

Konferenz	35th Annual IEEE Applied Power Electronics Conference and Exposition
Kurztitel	APEC 2020
Land/Gebiet	USA / Vereinigte Staaten
Ort	New Orleans
Zeitraum	15/03/20 → 19/03/20

ASJC Scopus subject areas

Elektrotechnik und Elektronik

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Application

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10.1109/APEC39645.2020.9124365

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Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress. / Fuchs, Michael; Sievers, Markus; Deutschmann, Bernd.
APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition. Institute of Electrical and Electronics Engineers, 2020. S. 2815-2821 9124365.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Fuchs, M, Sievers, M & Deutschmann, B 2020, Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress. in APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition., 9124365, Institute of Electrical and Electronics Engineers, S. 2815-2821, 35th Annual IEEE Applied Power Electronics Conference and Exposition, New Orleans, USA / Vereinigte Staaten, 15/03/20. https://doi.org/10.1109/APEC39645.2020.9124365

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title = "Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress",

abstract = "This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.",

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AB - This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.

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KW - EMI simulations

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KW - High Voltage

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BT - APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition

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Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress

Abstract

Konferenz

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

Zugriff auf Dokument

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