Topography effects in AFM force mapping experiments on xylan-decorated cellulose thin films.

Christian Ganser, Katrin Niegelhell, Caterina Czibula, Angela Chemelli, Christian Teichert, Robert Schennach, Stefan. Spirk

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

Xylan-coated cellulose thin films has been investigated by means of at. force microscopy (AFM) and force mapping expts. The birch xylan deposition on the film was performed under control by means of a multiple parameter surface plasmon resonance spectroscopy (MP-SPR) under dynamic conditions. The coated films were submitted to AFM in phase imaging mode to force mapping with modified AFM tips (sensitive to hydrophilic OH and hydrophobic CH3 groups) in order to characterize and localize the xylan on the surfaces. At the first glance, a clear difference in the adhesion force between xylan-coated areas and cellulose has been obsd. However, these different adhesion forces originate from topog. effects, which prevent an unambiguous identification and subsequent localization of the xylan on the cellulosic surfaces. [on SciFinder(R)]
Originalsprachedeutsch
Seiten (von - bis)1115-1123
Seitenumfang9
FachzeitschriftHolzforschung
Jahrgang70
Ausgabenummer12
DOIs
PublikationsstatusVeröffentlicht - 2016

Schlagwörter

  • topog effect AFM force mapping expt xylan decorated cellulose

Fields of Expertise

  • Advanced Materials Science

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