To what extend do contact-mode and indirect ESD test methods reproduce reality ?

David Johannes Pommerenke; M. Aidam

doi:10.1109/EOSESD.1995.478274

To what extend do contact-mode and indirect ESD test methods reproduce reality ?

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

Currents, current derivatives and transient fields of ESDs of humans are compared to currents and fields caused by simulators. A method for the simulation of the discharge current is provided. This method includes an arc model. The resulting high peak current values (>10 A/kV) are validated by a simple physical model of the hand geometry. Investigations of transient fields from simulators point to differences between simulators from different manufactures and between the transient fields caused by humans compared to the fields from simulators. Suggestions for possible improvements of the ESD test standard are given.

Originalsprache	englisch
Titel	Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1995
Seiten	101-109
DOIs	https://doi.org/10.1109/EOSESD.1995.478274
Publikationsstatus	Veröffentlicht - 1995
Extern publiziert	Ja
Veranstaltung	17th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 1995 - Phoenix, USA / Vereinigte Staaten Dauer: 12 Sept. 1995 → 14 Sept. 1995

Konferenz

Konferenz	17th Annual Electrical Overstress/Electrostatic Discharge Symposium
Kurztitel	EOS 17
Land/Gebiet	USA / Vereinigte Staaten
Ort	Phoenix
Zeitraum	12/09/95 → 14/09/95

Zugriff auf Dokument

10.1109/EOSESD.1995.478274

Dieses zitieren

@inproceedings{bceb7fbe98074383a1584f554c92f9e1,

title = "To what extend do contact-mode and indirect ESD test methods reproduce reality ?",

abstract = "Currents, current derivatives and transient fields of ESDs of humans are compared to currents and fields caused by simulators. A method for the simulation of the discharge current is provided. This method includes an arc model. The resulting high peak current values (>10 A/kV) are validated by a simple physical model of the hand geometry. Investigations of transient fields from simulators point to differences between simulators from different manufactures and between the transient fields caused by humans compared to the fields from simulators. Suggestions for possible improvements of the ESD test standard are given.",

author = "Pommerenke, {David Johannes} and M. Aidam",

year = "1995",

doi = "10.1109/EOSESD.1995.478274",

language = "English",

isbn = "1-878303-59-7",

pages = "101--109",

booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1995",

note = "17th Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 1995, EOS 17 ; Conference date: 12-09-1995 Through 14-09-1995",