Time-resolved simultaneous detection of structural and chemical changes during self-assembly of mesostructured films

Plinio Innocenzi; Luca Malfatti; Tongjit Kidchob; Stefano Costacurta; Paolo Falcaro; Massimo Piccinini; Augusto Marcelli; Pierangelo Morini; Diego Sali; Heinz Amenitsch

doi:10.1021/jp066566c

Time-resolved simultaneous detection of structural and chemical changes during self-assembly of mesostructured films

Plinio Innocenzi^*, Luca Malfatti, Tongjit Kidchob, Stefano Costacurta, Paolo Falcaro, Massimo Piccinini, Augusto Marcelli, Pierangelo Morini, Diego Sali, Heinz Amenitsch

^*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Abstract

In situ and time-resolved simultaneous analysis by two different and complementary techniques, Fourier transform infrared spectroscopy (FTIR) and small-angle X-ray scattering (SAXS), has been developed. A conventional source for the infrared light and synchrotron radiation for the X-ray beam have been used. The new technique has been applied to the study of self-assembling mesostructured films during dip-coating. The combined FTIR and SAXS analytical approach has given the possibility of getting a direct correlation between the chemical processes and the structural changes occurring in the film during the deposition.

Originalsprache	englisch
Seiten (von - bis)	5345-5350
Seitenumfang	6
Fachzeitschrift	The Journal of Physical Chemistry C
Jahrgang	111
Ausgabenummer	14
DOIs	https://doi.org/10.1021/jp066566c
Publikationsstatus	Veröffentlicht - 12 Apr. 2007
Extern publiziert	Ja

ASJC Scopus subject areas

Physikalische und Theoretische Chemie
Energie (insg.)
Elektronische, optische und magnetische Materialien
Oberflächen, Beschichtungen und Folien

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10.1021/jp066566c

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@article{84999fa9df8642719fed8490da230875,

title = "Time-resolved simultaneous detection of structural and chemical changes during self-assembly of mesostructured films",

abstract = "In situ and time-resolved simultaneous analysis by two different and complementary techniques, Fourier transform infrared spectroscopy (FTIR) and small-angle X-ray scattering (SAXS), has been developed. A conventional source for the infrared light and synchrotron radiation for the X-ray beam have been used. The new technique has been applied to the study of self-assembling mesostructured films during dip-coating. The combined FTIR and SAXS analytical approach has given the possibility of getting a direct correlation between the chemical processes and the structural changes occurring in the film during the deposition.",

author = "Plinio Innocenzi and Luca Malfatti and Tongjit Kidchob and Stefano Costacurta and Paolo Falcaro and Massimo Piccinini and Augusto Marcelli and Pierangelo Morini and Diego Sali and Heinz Amenitsch",

year = "2007",

month = apr,

day = "12",

doi = "10.1021/jp066566c",

language = "English",

volume = "111",

pages = "5345--5350",

journal = "The Journal of Physical Chemistry C",

issn = "1932-7447",

publisher = "American Chemical Society",

number = "14",

}

TY - JOUR

T1 - Time-resolved simultaneous detection of structural and chemical changes during self-assembly of mesostructured films

AU - Innocenzi, Plinio

AU - Malfatti, Luca

AU - Kidchob, Tongjit

AU - Costacurta, Stefano

AU - Falcaro, Paolo

AU - Piccinini, Massimo

AU - Marcelli, Augusto

AU - Morini, Pierangelo

AU - Sali, Diego

AU - Amenitsch, Heinz

PY - 2007/4/12

Y1 - 2007/4/12

N2 - In situ and time-resolved simultaneous analysis by two different and complementary techniques, Fourier transform infrared spectroscopy (FTIR) and small-angle X-ray scattering (SAXS), has been developed. A conventional source for the infrared light and synchrotron radiation for the X-ray beam have been used. The new technique has been applied to the study of self-assembling mesostructured films during dip-coating. The combined FTIR and SAXS analytical approach has given the possibility of getting a direct correlation between the chemical processes and the structural changes occurring in the film during the deposition.

AB - In situ and time-resolved simultaneous analysis by two different and complementary techniques, Fourier transform infrared spectroscopy (FTIR) and small-angle X-ray scattering (SAXS), has been developed. A conventional source for the infrared light and synchrotron radiation for the X-ray beam have been used. The new technique has been applied to the study of self-assembling mesostructured films during dip-coating. The combined FTIR and SAXS analytical approach has given the possibility of getting a direct correlation between the chemical processes and the structural changes occurring in the film during the deposition.

UR - http://www.scopus.com/inward/record.url?scp=34248194238&partnerID=8YFLogxK

U2 - 10.1021/jp066566c

DO - 10.1021/jp066566c

M3 - Article

AN - SCOPUS:34248194238

SN - 1932-7447

VL - 111

SP - 5345

EP - 5350

JO - The Journal of Physical Chemistry C

JF - The Journal of Physical Chemistry C

IS - 14

ER -

Time-resolved simultaneous detection of structural and chemical changes during self-assembly of mesostructured films

Abstract

ASJC Scopus subject areas

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