The use of maximum entropy and Bayesian statistics in ion-beam applications

V. M. Prozesky; J. Padayachee; R. Fischer; W. Von Der Linden; V. Dose; C. G. Ryan

doi:10.1063/1.52523

The use of maximum entropy and Bayesian statistics in ion-beam applications

V. M. Prozesky, J. Padayachee, R. Fischer, W. Von Der Linden, V. Dose, C. G. Ryan

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband

Abstract

An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.

Originalsprache	englisch
Titel	AIP Conference Proceedings
Erscheinungsort	Denton, Texas
Seiten	595-598
Seitenumfang	4
Band	392
DOIs	https://doi.org/10.1063/1.52523
Publikationsstatus	Veröffentlicht - 1 Feb. 1997

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10.1063/1.52523

http://aip.scitation.org/doi/abs/10.1063/1.52523

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title = "The use of maximum entropy and Bayesian statistics in ion-beam applications",

abstract = "An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.",

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year = "1997",

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AU - Prozesky, V. M.

AU - Padayachee, J.

AU - Fischer, R.

AU - Von Der Linden, W.

AU - Dose, V.

AU - Ryan, C. G.

PY - 1997/2/1

Y1 - 1997/2/1

N2 - An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.

AB - An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.

U2 - 10.1063/1.52523

DO - 10.1063/1.52523

M3 - Conference paper

VL - 392

SP - 595

EP - 598

BT - AIP Conference Proceedings

CY - Denton, Texas

ER -

The use of maximum entropy and Bayesian statistics in ion-beam applications

Abstract

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