The repeatability of system level ESD test and relevant ESD generator parameters

Jayong Koo, Qing Cai, David Pommerenke, Kai Wang, John Mass, Masayuki Hirata, Andy Martwick

Publikation: Beitrag in einer FachzeitschriftKonferenzartikel

Abstract

Some system level ESD tests do not repeat well if different ESD generators are used. For improving the test repeatability, ESD generator specifications were considered to be changed and a world wide Round Robin test were performed in 2006 to compare the modified and unmodified ESD generators. The test results show the failure level variations up to 1:3 for an EUT among eight different ESD generators. Multiple ESD parameters including discharge currents and transient fields have been measured. This paper tries to find which parameters would predict the failure level the best in general. The transient fields show large variations among different ESD generators. The voltage induced in a semi-circular loop and the ringing after first discharge current peak show the best correlation to failure levels. The regulation on the transient field is expected to improve the test repeatability.

Originalspracheenglisch
Aufsatznummer4652119
FachzeitschriftIEEE International Symposium on Electromagnetic Compatibility
Jahrgang2008-January
DOIs
PublikationsstatusVeröffentlicht - 1 Jan 2008
Extern publiziertJa
Veranstaltung2008 IEEE International Symposium on Electromagnetic Compatibility: EMC 2008 - Detroit, USA / Vereinigte Staaten
Dauer: 18 Aug 200822 Aug 2008

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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