The Development of an EM-Field Probing System for Manual Near-Field Scanning

Hui He, Pratik Maheshwari, David J. Pommerenke

Publikation: Beitrag in einer FachzeitschriftArtikel


This research was conducted to visualize the frequency-dependent electromagnetic field distribution for electromagnetic compatibility (EMC) applications and the time evolution of the current flow induced by an electrostatic discharge (ESD) on complex-shaped electronic systems. These objectives were achieved by combining magnetic field probing with a system that automatically records the probe's position and orientation. The local magnetic field associated with the probe location was recorded and displayed at near real time on the captured 3-D geometry. Consequently, a field strength map was obtained for EMC applications. Also, a video showing the spreading of the ESD-induced current with subnanosecond resolution was captured for ESD applications after the ESD-induced surface current density associated with the probe location was recorded.

Seiten (von - bis)356-363
FachzeitschriftIEEE Transactions on Electromagnetic Compatibility
PublikationsstatusVeröffentlicht - 1 Apr 2016
Extern publiziertJa

ASJC Scopus subject areas

  • !!Atomic and Molecular Physics, and Optics
  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

Fingerprint Untersuchen Sie die Forschungsthemen von „The Development of an EM-Field Probing System for Manual Near-Field Scanning“. Zusammen bilden sie einen einzigartigen Fingerprint.

  • Dieses zitieren