Ternary feature masks: zero-forgetting for task-incremental learning

M. Masana*, T. Tuytelaars, J. Van De Weijer

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandBegutachtung

Abstract

We propose an approach without any forgetting to continual learning for the task-aware regime, where at inference the task-label is known. By using ternary masks we can upgrade a model to new tasks, reusing knowledge from previous tasks while not forgetting anything about them. Using masks prevents both catastrophic forgetting and backward transfer. We argue--and show experimentally--that avoiding the former largely compensates for the lack of the latter, which is rarely observed in practice. In contrast to earlier works, our masks are applied to the features (activations) of each layer instead of the weights. This considerably reduces the number of mask parameters for each new task; with more than three orders of magnitude for most networks. The encoding of the ternary masks into two bits per feature creates very little overhead to the network, avoiding scalability issues. To allow already learned features to adapt to the current task without changing the behavior of these features for previous tasks, we introduce task-specific feature normalization. Extensive experiments on several finegrained datasets and ImageNet show that our method outperforms current state-of-the-art while reducing memory overhead in comparison to weight-based approaches.
Originalspracheenglisch
TitelProceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
Seiten3565-3574
Seitenumfang10
ISBN (elektronisch)9781665448994
DOIs
PublikationsstatusVeröffentlicht - Juni 2021
Extern publiziertJa
Veranstaltung2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops: CVPRW 2021 - Virtuell, USA / Vereinigte Staaten
Dauer: 19 Juni 202125 Juni 2021

Publikationsreihe

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (elektronisch)2160-7516

Konferenz

Konferenz2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops
KurztitelCVPRW 2021
Land/GebietUSA / Vereinigte Staaten
OrtVirtuell
Zeitraum19/06/2125/06/21

ASJC Scopus subject areas

  • Elektrotechnik und Elektronik
  • Maschinelles Sehen und Mustererkennung

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