Temperature dependent bais-stress measurement in organic thin film transistors

Thomas Obermüller, Marco Marchl, Simon Josef Außerlechner, Andrej Golubkov, Anja Haase, Barbara Stadlober, Lucas Hauser, Gregor Trimmel, Matthias Edler, Thomas Grießer, Wolfgang Kern, Egbert Zojer

Publikation: KonferenzbeitragPosterForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 2009
VeranstaltungInternational Conference on Organic Electronics 2009 - University of Liverpool, Liverpool, UK
Dauer: 15 Jun 200917 Jun 2009

Konferenz

KonferenzInternational Conference on Organic Electronics 2009
OrtUniversity of Liverpool, Liverpool, UK
Zeitraum15/06/0917/06/09

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

Dies zitieren

Obermüller, T., Marchl, M., Außerlechner, S. J., Golubkov, A., Haase, A., Stadlober, B., ... Zojer, E. (2009). Temperature dependent bais-stress measurement in organic thin film transistors. Postersitzung präsentiert bei International Conference on Organic Electronics 2009, University of Liverpool, Liverpool, UK, .

Temperature dependent bais-stress measurement in organic thin film transistors. / Obermüller, Thomas; Marchl, Marco; Außerlechner, Simon Josef; Golubkov, Andrej; Haase, Anja; Stadlober, Barbara; Hauser, Lucas; Trimmel, Gregor; Edler, Matthias; Grießer, Thomas; Kern, Wolfgang; Zojer, Egbert.

2009. Postersitzung präsentiert bei International Conference on Organic Electronics 2009, University of Liverpool, Liverpool, UK, .

Publikation: KonferenzbeitragPosterForschung

Obermüller, T, Marchl, M, Außerlechner, SJ, Golubkov, A, Haase, A, Stadlober, B, Hauser, L, Trimmel, G, Edler, M, Grießer, T, Kern, W & Zojer, E 2009, 'Temperature dependent bais-stress measurement in organic thin film transistors', University of Liverpool, Liverpool, UK, 15/06/09 - 17/06/09, .
Obermüller T, Marchl M, Außerlechner SJ, Golubkov A, Haase A, Stadlober B et al. Temperature dependent bais-stress measurement in organic thin film transistors. 2009. Postersitzung präsentiert bei International Conference on Organic Electronics 2009, University of Liverpool, Liverpool, UK, .
Obermüller, Thomas ; Marchl, Marco ; Außerlechner, Simon Josef ; Golubkov, Andrej ; Haase, Anja ; Stadlober, Barbara ; Hauser, Lucas ; Trimmel, Gregor ; Edler, Matthias ; Grießer, Thomas ; Kern, Wolfgang ; Zojer, Egbert. / Temperature dependent bais-stress measurement in organic thin film transistors. Postersitzung präsentiert bei International Conference on Organic Electronics 2009, University of Liverpool, Liverpool, UK, .
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title = "Temperature dependent bais-stress measurement in organic thin film transistors",
author = "Thomas Oberm{\"u}ller and Marco Marchl and Au{\ss}erlechner, {Simon Josef} and Andrej Golubkov and Anja Haase and Barbara Stadlober and Lucas Hauser and Gregor Trimmel and Matthias Edler and Thomas Grie{\ss}er and Wolfgang Kern and Egbert Zojer",
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T1 - Temperature dependent bais-stress measurement in organic thin film transistors

AU - Obermüller, Thomas

AU - Marchl, Marco

AU - Außerlechner, Simon Josef

AU - Golubkov, Andrej

AU - Haase, Anja

AU - Stadlober, Barbara

AU - Hauser, Lucas

AU - Trimmel, Gregor

AU - Edler, Matthias

AU - Grießer, Thomas

AU - Kern, Wolfgang

AU - Zojer, Egbert

PY - 2009

Y1 - 2009

M3 - Poster

ER -