Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits

Maximilian Hofer, Christoph Böhm, Wolfgang Pribyl

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalsprachedeutsch
TitelISIC2011
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
PublikationsstatusAngenommen/In Druck - 2011
VeranstaltungInternational Symposium on Integrated Circuits, ISIC - Singapur, Singapur
Dauer: 12 Dez 201115 Dez 2011

Konferenz

KonferenzInternational Symposium on Integrated Circuits, ISIC
LandSingapur
OrtSingapur
Zeitraum12/12/1115/12/11

Fields of Expertise

  • Information, Communication & Computing

Dies zitieren

Hofer, M., Böhm, C., & Pribyl, W. (Angenommen/Im Druck). Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. in ISIC2011 Institute of Electrical and Electronics Engineers.

Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. / Hofer, Maximilian; Böhm, Christoph; Pribyl, Wolfgang.

ISIC2011. Institute of Electrical and Electronics Engineers, 2011.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Hofer, M, Böhm, C & Pribyl, W 2011, Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. in ISIC2011. Institute of Electrical and Electronics Engineers, Singapur, Singapur, 12/12/11.
Hofer M, Böhm C, Pribyl W. Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. in ISIC2011. Institute of Electrical and Electronics Engineers. 2011
Hofer, Maximilian ; Böhm, Christoph ; Pribyl, Wolfgang. / Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. ISIC2011. Institute of Electrical and Electronics Engineers, 2011.
@inproceedings{ea70b7006dcb4a3b93a5bbfb2135a0ff,
title = "Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits",
author = "Maximilian Hofer and Christoph B{\"o}hm and Wolfgang Pribyl",
year = "2011",
language = "deutsch",
booktitle = "ISIC2011",
publisher = "Institute of Electrical and Electronics Engineers",
address = "USA / Vereinigte Staaten",

}

TY - GEN

T1 - Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits

AU - Hofer, Maximilian

AU - Böhm, Christoph

AU - Pribyl, Wolfgang

PY - 2011

Y1 - 2011

M3 - Beitrag in einem Konferenzband

BT - ISIC2011

PB - Institute of Electrical and Electronics Engineers

ER -