TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits

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Originalsprache	englisch
Titel	VLSI in the nanometer era
Erscheinungsort	New York, NY
Herausgeber (Verlag)	Association of Computing Machinery
Seiten	76-79
ISBN (Print)	1-58113-677-3
DOIs	https://doi.org/10.1145/764808.764829
Publikationsstatus	Veröffentlicht - 2003
Veranstaltung	ACM Great Lakes Symposium on VLSI - Washington, D.C., USA / Vereinigte Staaten Dauer: 28 Apr. 2003 → 29 Apr. 2003

Konferenz	ACM Great Lakes Symposium on VLSI
Land/Gebiet	USA / Vereinigte Staaten
Ort	Washington, D.C.
Zeitraum	28/04/03 → 29/04/03

Fields of Expertise

@inproceedings{07f5c8f2920946cf843d482cb36fecb8,

title = "TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits",

author = "Timm Ostermann and Bernd Deutschmann",

year = "2003",

doi = "10.1145/764808.764829",

language = "English",

isbn = "1-58113-677-3",

pages = "76--79",

booktitle = "VLSI in the nanometer era",

publisher = "Association of Computing Machinery",

address = "United States",

note = "ACM Great Lakes Symposium on VLSI ; Conference date: 28-04-2003 Through 29-04-2003",

}

TY - GEN

T1 - TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits

AU - Ostermann, Timm

AU - Deutschmann, Bernd

PY - 2003

Y1 - 2003

U2 - 10.1145/764808.764829

DO - 10.1145/764808.764829

M3 - Conference paper

SN - 1-58113-677-3

SP - 76

EP - 79

BT - VLSI in the nanometer era

PB - Association of Computing Machinery

CY - New York, NY

T2 - ACM Great Lakes Symposium on VLSI

Y2 - 28 April 2003 through 29 April 2003

ER -