Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge (ESD) problems

Giorgi Muchaidze; Jayong Koo; Qing Cai; Tun Li; Lijun Han; Andrew Martwick; Kai Wang; Jin Min; James L. Drewniak; David Pommerenke

doi:10.1109/TEMC.2008.921059

Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge (ESD) problems

Giorgi Muchaidze^*, Jayong Koo, Qing Cai, Tun Li, Lijun Han, Andrew Martwick, Kai Wang, Jin Min, James L. Drewniak, David Pommerenke

^*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Abstract

Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

Originalsprache	englisch
Seiten (von - bis)	268-276
Seitenumfang	9
Fachzeitschrift	IEEE Transactions on Electromagnetic Compatibility
Jahrgang	50
Ausgabenummer	2
DOIs	https://doi.org/10.1109/TEMC.2008.921059
Publikationsstatus	Veröffentlicht - 1 Mai 2008
Extern publiziert	Ja

ASJC Scopus subject areas

Atom- und Molekularphysik sowie Optik
Physik der kondensierten Materie
Elektrotechnik und Elektronik

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author = "Giorgi Muchaidze and Jayong Koo and Qing Cai and Tun Li and Lijun Han and Andrew Martwick and Kai Wang and Jin Min and Drewniak, {James L.} and David Pommerenke",

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AU - Muchaidze, Giorgi

AU - Koo, Jayong

AU - Cai, Qing

AU - Li, Tun

AU - Han, Lijun

AU - Martwick, Andrew

AU - Wang, Kai

AU - Min, Jin

AU - Drewniak, James L.

AU - Pommerenke, David

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N2 - Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

AB - Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

KW - Electrostatic discharges (ESDs)

KW - Immunity

KW - Scanning

KW - Susceptibility

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JO - IEEE Transactions on Electromagnetic Compatibility

JF - IEEE Transactions on Electromagnetic Compatibility

SN - 0018-9375

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ER -

Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge (ESD) problems

Abstract

ASJC Scopus subject areas

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